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MathSciNet bibliographic data
MR2667704 60K37 (60J55 60K35 82C44)
Birkner, Matthias; Sun, Rongfeng Annealed vs quenched critical points for a random walk pinning model. Ann. Inst. Henri Poincaré Probab. Stat. 46 (2010), no. 2, 414–441.
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