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Quarterly of Applied Mathematics

Quarterly of Applied Mathematics

Online ISSN 1552-4485; Print ISSN 0033-569X

   
 
 

 

Identification of semiconductor contact resistivity


Authors: Stavros Busenberg and Weifu Fang
Journal: Quart. Appl. Math. 49 (1991), 639-649
MSC: Primary 35Q60; Secondary 35R30, 78A55
DOI: https://doi.org/10.1090/qam/1134746
MathSciNet review: MR1134746
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  • W. H. Loh, Modelling and measurement of contact resistance, Stanford Electronic Labs., Tech. Rep., No. G830-1, Dec. 1987 W. H. Loh, K. Saraswat, and R. W. Dutton, Analysis and scaling of Kelvin resistors for extraction of specific contact resistivity, IEEE Electrion Device Letters 6 (3), 105–108 (1985)
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  • John R. Rice and Ronald F. Boisvert, Solving elliptic problems using ELLPACK, Springer Series in Computational Mathematics, vol. 2, Springer-Verlag, Berlin, 1985. With appendices by W. R. Dyksen, E. N. Houstis, Rice, J. F. Brophy, C. J. Ribbens and W. A. Ward. MR 772025
  • G. F. Roach, Green’s functions, 2nd ed., Cambridge University Press, Cambridge-New York, 1982. MR 660842
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Article copyright: © Copyright 1991 American Mathematical Society